Lecture | Test & Reliability Challenges in Advanced Technology Nodes
Visiting professor Dr Victor Champac to deliver lecture on Nov 13
On Nov 13, at 7 PM, the professor of the National Institute of Astrophysics, Optics and Electronics, Mexico, Dr Victor Champac will be delivering the lecture Test & Reliability Challenges in Advanced Technology Nodes, as a visiting professor in support of the Institutional Project of Internationalization (PUCRS-PrInt).
Champac will address FinFET technology, which is adopted for high performance and energy saving applications. FinFET-based circuits have shown substantial gains at low operating voltage. Essential challenges in design and testing tasks will also be addressed.
The session will occur at on the Main Campus Room 517 of Building 32 on the Main Campus (av. Ipiranga, 6.681). The lecture will be delivered in English. No interpreting will be provided. No early registration is required.